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2064VL Datasheet (PDF) - Lattice Semiconductor

2064VL Datasheet PDF - Lattice Semiconductor
Part # 2064VL
Download  2064VL Download

File Size   188.06 Kbytes
Page   14 Pages
Manufacturer  LATTICE [Lattice Semiconductor]
Direct Link  http://www.latticesemi.com
Logo LATTICE - Lattice Semiconductor
Description 2.5V In-System Programmable SuperFAST??High Density PLD

2064VL Datasheet (PDF)

Go To PDF Page Download Datasheet
2064VL Datasheet PDF - Lattice Semiconductor

Part # 2064VL
Download  2064VL Click to download

File Size   188.06 Kbytes
Page   14 Pages
Manufacturer  LATTICE [Lattice Semiconductor]
Direct Link  http://www.latticesemi.com
Logo LATTICE - Lattice Semiconductor
Description 2.5V In-System Programmable SuperFAST??High Density PLD

2064VL Datasheet (HTML) - Lattice Semiconductor

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2064VL Product details

Description
The ispLSI 2064VL is a High Density Programmable Logic Device available in 64 and 32 I/O-pin versions. The device contains 64 Registers, four Dedicated Input pins, three Dedicated Clock Input pins, two dedicated Global OE input pins and a Global Routing Pool (GRP).
   
Features
• SuperFAST HIGH DENSITY PROGRAMMABLE LOGIC
    — 2000 PLD Gates
    — 64 and 32 I/O Pin Versions, Four Dedicated Inputs
    — 64 Registers
    — High Speed Global Interconnect
    — Wide Input Gating for Fast Counters, State
        Machines, Address Decoders, etc.
    — Small Logic Block Size for Random Logic
    — 100% Functional, JEDEC and Pinout Compatible with
        ispLSI 2064V and 2064VE Devices
• 2.5V LOW VOLTAGE 2064 ARCHITECTURE
    — Interfaces with Standard 3.3V TTL Devices (Inputs
        and I/Os are 3.3V Tolerant)
    — 60 mA Typical Active Current
• HIGH-PERFORMANCE E2CMOS® TECHNOLOGY
    — fmax = 165MHz Maximum Operating Frequency
    — tpd = 5.5ns Propagation Delay
    — Electrically Erasable and Reprogrammable
    — Non-Volatile
    — 100% Tested at Time of Manufacture
    — Unused Product Term Shutdown Saves Power
• IN-SYSTEM PROGRAMMABLE
    — 2.5V In-System Programmability (ISP™) Using
        Boundary Scan Test Access Port (TAP)
    — Open-Drain Output Option for Flexible Bus Interface
        Capability, Allowing Easy Implementation of Wired-OR
        or Bus Arbitration Logic
    — Increased Manufacturing Yields, Reduced Time-toMarket
        and Improved Product Quality
    — Reprogram Soldered Devices for Faster Prototyping
• 100% IEEE 1149.1 BOUNDARY SCAN TESTABLE
• THE EASE OF USE AND FAST SYSTEM SPEED OF
    PLDs WITH THE DENSITY AND FLEXIBILITY OF FPGAs
    — Enhanced Pin Locking Capability
    — Three Dedicated Clock Input Pins
    — Synchronous and Asynchronous Clocks
    — Programmable Output Slew Rate Control
    — Flexible Pin Placement
    — Optimized Global Routing Pool Provides Global
        Interconnectivity
• ispDesignEXPERT™ – LOGIC COMPILER AND COMPLETE
    ISP DEVICE DESIGN SYSTEMS FROM HDL
    SYNTHESIS THROUGH IN-SYSTEM PROGRAMMING
    — Superior Quality of Results
    — Tightly Integrated with Leading CAE Vendor Tools
    — Productivity Enhancing Timing Analyzer, Explore
        Tools, Timing Simulator and ispANALYZER™
    — PC and UNIX Platforms
   




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